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Technique Technique | Equipment Automatic control system failure or breach of the functioning of electronic devices
Technique Technique | Equipment Automatic control system failure or breach of the functioning of electronic devices
| Automatic control system failure or breach of the functioning of electronic devices |
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| Written by Алексей Сидорский | |
| Thursday, 27 March 2008 | |
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Transferred via translate.google.com
Back in 1994, to find faults in the devices containing tens of shells chips, I used the method of measurement of heat, allowing to locate the fault with high accuracy, and in some cases replaced by another functional element, but with a deviation of the parameters, and potentially unreliable. Then came the idea of applying this method to maintain the responsible electronic equipment in working condition and replacement (hot backup) potentially unreliable nodes. Back in 1994, to find faults in the devices containing Dozens of shells chips, I used method for measuring heat, thus locate the fault with high accuracy, and some cases replaced by another functional element, but with deviations of parameters and potentially unreliable. Then came the idea of applying this method to maintain responsible electronic equipment in working condition and replace (hot backup) potentially unreliable nodes. Currently, the level of development of microelectronics will enable to implement the software and hardware for a permanent heat scanner electronic device. Sites and software: The node distance measurements of temperature at a point. Mechanical scanning of the site. Microprocessor unit. For the control you need to create (write with a working device) patterns of heat and set the limits of deviation. The device scans the memory "image" of the heat, and compares it with the template. Perhaps sdelst bind to the mode of a device that will increase the likelihood of rejection assumptions. When otkloneiyah take actions to move to the backup copy of the device and replaced. This method allows to detect faults inside the chips, breach of contact m field rations, a violation of cross-section of conductors, "breakdown" - fault, breach of contact elements and heat exchangers. Method adaptiven and can be used to control mechanical losses in units of machines and aggregates. |